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VS-STYLUS Constant Distance SECM

VS STYLUS is a soft probe SECM technique for constant distance imaging


  • STYLUS is developed and supplied through an exclusive partnership with SENSáSION, EPFL
  • Eliminates many of the experimental difficulties of approximation curves and changing the distance between probe and sample that are associated with standard SECM techniques


Applications and Software


In collaboration with SECM:SECM, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and collaborators from the Physical and Analytical Electrochemistry Laboratory ( LEPA) in la  Ecole Polytechnique Fédérale de Lausanne  (EPFL) for SECM constant distance. Probe technology offers the following benefits:


  • Constant Distance SECM: SECM images without major topographic artifacts. Ideal for sloped, corrugated, and rough samples.
  • Soft Sample Contact – With up to 1000 times less contact force than hard probe technology, soft probes are ideal for studying biological samples in SECM constant distance mode.
  • Low cost: No additional hardware or special feedback control electronics are needed to control the vertical position of the probe relative to the sample. Least cost constant distance SECM method commercially available
  • Faster measurements: no need to measure topography before SECM scans. Fast approximation curve to find sample surface.
  • Flexible and stable probes – no risk of damaging the probe or sample during positioning and scanning.
  • A small tip-to-substrate distance is easily achieved, greatly improving contrast imaging and image resolution.
  • Easy electrode preparation: electrode tips can be trimmed after each use to ensure a clean surface. Replacement probes can be purchased.
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