ModuLab XM Photoelectrochemical Test System

• Frequency and time domain techniques including IMPS, IMVS, impedance, photovoltage drop, charge extraction, IV
• Automatic analysis to calculate effective diffusion coefficients and electron lifetimes
• NIST Traceable Light Source Calibration
• Excellent thermal management of light sources for long-term stability
• Full suite of electrochemical techniques (cyclic voltammetry, chrono methods, galvano methods, impedance, and AC voltammetry)
• IPCE option for quantum efficiency measurements
• Scalable platform for electrochemistry and materials testing
• ModuLab XM PhotoEchem's impedance accuracy contour plot highlights Solartron's best-in-class measurement performance.

 

Applications and Software

 

The ModuLab XM PhotoEchem is a dedicated system for the following applications:

 

 

IMPS	Effective electron diffusion coefficient
IMVS	Effective lifetime of electrons
Photovoltage decay	Effective lifetime of electrons
IV.	Fill factor, Pmax, Voc, Isc, Efficiency
Cargo Extraction - Dark	Trapped charge density
Load Extraction - Short circuit	Trapped charge density
IPCE option	Quantum efficiency
AC measurement	Impedance / Capacitance