top of page


ModuLab XM MTS - Material Testing System

ModuLab XM MTS is a configurable design for materials, electrochemical and photovoltaic measurements



  • Wider Impedance Range - µohms to >100 Tohms
  • Instant switching between time (IV, rapid pulse) and AC (CV, impedance, Mott-Schottky) domain measurements without changing sample connections
  • Low frequency to 10 µHz for studies of degradation, trap status and material purity
  • Plug and Play options include: Femto and Sample/Reference modes (for dielectrics/insulators)
  • XM-Studio software is included with all XM-series systems
  • The ModuLab XM MTS Impedance Precision Contour Plot highlights Solartron's best-in-class measurement performance.



Applications and Software


The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to oven levels and integrate through control of software with the central measurement electronics to create a system to study a wide range of materials. As with other ModuLab platform systems, it can be extended for electrochemical or photoelectrochemical experiments.


The ModuLab MTS XM Impedance Accuracy Contour Plot highlights Solartron's best-in-class measurement performance.


El ModuLab MTS XM  is a modular system that can be configured for the following applications:


  1. Materials dielectrics: Ferro/piezoelectric | MEM | NEM | multiferroics |Polymers | Solid oxides SOFC | ionic conductors |Solid electrolytes, quantum dots
  2. Electronic materials: LEDs | LCD | OLED | MEM | IPO | Yes | DSSC | OFET |Ge | GaAs | perovskite materials
bottom of page