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FAST SDD® Ultra High Performance Silicon Drift Detector

Amptek recently added in-house silicon wafer fabrication and improved the process. The result is a detector with lower noise, lower leakage current, better charge collection, and detector-to-detector uniformity._cc781905- 5cde-3194-bb3b-136bad5cf58d_This makes it the best performing silicon drift detector available and the true state of the art.


The FAST SDD® represents Amptek's highest performance silicon drift detector (SDD), capable of count rates of over 1,000,000 CPS (counts per second) while maintaining excellent resolution._cc781905-5cde-3194-bb3b- 136bad5cf58d_The FAST SDD® is also available with our patented C-series (Si3N4) low energy windows for soft X-ray analysis.



General description


Unlike conventional SDDs that use a junction gate field effect transistor (JFET) inside hermetically sealed TO-8 package, along with an external preamplifier, the FAST SDD uses a complementary metal oxide semiconductor preamplifier ( CMOS) inside the TO-8 and replaces the JFET with a metal oxide semiconductor field-effect transistor (MOSFET). This significantly reduces capacitance, giving much series noise lower and produces improved resolution at very short peak times. The FAST SDD® uses the same detector but with a preamplifier that provides lower noise at short peak times._cc781905-5cde-3194 -bb3b-136bad5cf58d_Enhanced (lower) resolution enables isolation/separation of fluorescent X-rays with near energy values where peaks would otherwise overlap, allowing users better identification of all items in their ) sample(s). Shorter peak times also produce significant improvements in count rates; more counts provide better statistics.





  • Ultra-fast benchtop and portable XRF analyzers
  • Sample scanning/mapping in a SEM as part of an EDS system
  • Online process control
  • X-ray sorting machines
  • space and astronomy
  • oem
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