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EDS (SEM) applications FAST SDD® and C2 Window

Amptek is pleased to offer our enhanced line of Silicon Drift Detectors (SDD) for Energy Dispersive Spectroscopy (EDS) use within Scanning Electron Microscopes (SEM). Using our windows de rayos X de nitruro de silicio (Si 3 N 4 ) patentadas "Serie C" , the low energy response of our FAST SDD ® extends to beryllium (Be)._cc781905-5cde-3194-bb3b-136bad5cf58dcc_The FAST194de581SDD -bb3b-136bad5cf58d_® with its high intrinsic efficiency it is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).


Systems include:


  • FAST SDD® – 2 25 mm o 2 70 mm
  • X-123 package with digital pulse processor and all power supplies
  • Vacuum Extender - 5 or 9 inches
  • vacuum flange


C2 window transmission efficiency


Element Window C2
li 29%
Be 13%
B. 19.7%
C. 43.9%
north 59.2%
F 69%
Northeast 72.9%
N/A 75.1%
magnesium 77.3%
Alabama 80.3%
Yeah 81.8%
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