EDS (SEM) applications FAST SDD® and C2 Window
Description
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Amptek is pleased to offer our enhanced line of Silicon Drift Detectors (SDD) for Energy Dispersive Spectroscopy (EDS) use within Scanning Electron Microscopes (SEM). Using our windows de rayos X de nitruro de silicio (Si 3 N 4 ) patentadas "Serie C" , the low energy response of our FAST SDD ® extends to beryllium (Be)._cc781905-5cde-3194-bb3b-136bad5cf58dcc_The FAST194de581SDD -bb3b-136bad5cf58d_® with its high intrinsic efficiency it is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
Systems include:
- FAST SDD® – 2 25 mm o 2 70 mm
- X-123 package with digital pulse processor and all power supplies
- Vacuum Extender - 5 or 9 inches
- vacuum flange
C2 window transmission efficiency
| Element | Window C2 Transmission |
|---|---|
| li | 29% |
| Be | 13% |
| B. | 19.7% |
| C. | 43.9% |
| north | 59.2% |
| EITHER | 62% |
| F | 69% |
| Northeast | 72.9% |
| N/A | 75.1% |
| magnesium | 77.3% |
| Alabama | 80.3% |
| Yeah | 81.8% |